| Home > Guidelines & Resources > Thin Film Metallization Specifications |
Since 1982, Ion Beam Milling has delivered thousands of products to our customers. During the past two and a half decades, we have seen many different metallization schemes, but certain ones stand out. The following charts list the most common metallization schemes requested by our customers. While this list covers the schemes we see most often, we can create a custom scheme to meet your specific requirements. Please contact us for details.
The common schemes listed below all accept the following standard die attach methods:
Ti/Pt/Au
|
Application Use |
Au/Ge and Au/Si eutectic compatibility. Film withstands 450°C process temperatures |
|
Advantages |
Very robust film on standard MIC dielectrics |
|
Solderability |
Both Au/Sn and Pb/Sn is recommended due to presence of Pt barrier layer |
|
Front Side Metallization |
Sputtered Ti 800A 1000A Sputtered Pt 1000 2000A Sputtered Au 3000 5000A, Plate 1-6 microns |
|
Back Side Metallization |
Same as Front Side |
TiW/Au
|
Application Use |
Robust film for MIC requirements |
|
Advantages |
Superior (Ti) adhesion to highly polished dielectrics |
|
Solderability |
Au/Sn is ideal, Pb/Sn not recommended due to lack of barrier layer |
|
Front Side Metallization |
Sputtered TiW 800A 1000A Sputtered Au 3000 5000A, Plate 1.5-6 microns |
|
Back Side Metallization |
Same as Front Side |
TiW/Ni/Au
|
Application Use |
General Microwave circuit applications without resistors. Upper temperature limit of 300°C |
|
Advantages |
Higher frequency performance without (TaN) resistor adhesion layer |
|
Solderability |
Both Au/Sn and Pb/Sn is recommended due to presence of Ni barrier layer |
|
Front Side Metallization |
Sputtered TiW 800A 1000A Sputtered Ni 1000-2000A Sputtered Au 3000 5000A, Plate 1-6 microns |
|
Back Side Metallization |
Same as Front Side |
TiW/Cu/Ni/Au
|
Application Use |
Low loss conductor (Cu) for higher current and power requirements. Ideal for low DCR spiral inductors |
|
Advantages |
Solderable and Wire-bondable to 300°C |
|
Solderability |
Both Au/Sn and Pb/Sn is recommended due to presence of Ni barrier layer |
|
Front Side Metallization |
Sputtered TiW 800A 1000A Sputtered or Plated Cu 1-6 microns Plated Ni 1 3 microns Plated Au 1.5-6 microns |
|
Back Side Metallization |
Same as Front Side / Alternative Formulation available per Customer requirement |
TiW/AU/Cu/Ni/Au
|
Application Use |
High Power/low loss requirements of (Cu) facilitates inductor and transmission line fabrication |
|
Advantages |
Primary conductor (Cu) has lower resistivity than Au. Lower cost alternative to thick Au conductors. |
|
Solderability |
Both Au/Sn and Pb/Sn is recommended due to presence of Ni barrier layer |
|
Front Side Metallization |
Sputtered TiW 800A 1000A Sputtered Au 3000-5000A Plated Cu 1-6 microns Plated Ni 1 3 microns Plated Au 1.5-6 microns |
|
Back Side Metallization |
Same as Front Side / Alternative Formulation available per Customer requirement |
Ti/ Au
|
Application Use |
Lower cost alternative for Au/Sn eutectic preform requirements. |
|
Advantages |
Ti has excellent adhesion to polished quartz |
|
Solderability |
Au/Sn is ideal, Pb/Sn not recommended due to lack of barrier layer |
|
Front Side Metallization |
Sputtered Ti 800A 1000A Sputtered Au 3000 5000A, Plate 1-6 microns |
|
Back Side Metallization |
Same as Front Side |
Tan/TiW/Au
|
Application Use |
Standard resistor/resistor network requirements |
|
Advantages |
Au/Ge and Au/Si attachment compatible |
|
Solderability |
Au/Sn is ideal, Pb/Sn not recommended due to lack of barrier layer |
|
Front Side Metallization |
Sputtered Tan (25 200 Ohms/Square) Sputtered TiW 800A 1000A Sputtered Au 3000 5000A, Plate 1-6 microns |
|
Back Side Metallization |
Sputtered TiW 800A 1000A Sputtered Au 3000 5000A, Plate 1-6 microns |
Tan/Ti/Ni/Au
|
Application Use |
RF/Microwave circuits, attenuators, and resistor/resistor network requirements. Wire-bondable (Au) and solderable |
|
Advantages |
TaN is passivated and is stable in a high humidity environment |
|
Solderability |
Both Au/Sn and Pb/Sn is recommended due to presence of Ni barrier layer |
|
Front Side Metallization |
Sputtered Tan (25 200 Ohms/Square) Sputtered Ti 800A 1000A Sputtered Ni 1000-2000A Sputtered Au 3000 5000A, Plate 1-6 microns |
|
Back Side Metallization |
Sputtered Ti 800A 1000A Sputtered Ni 1000-2000A Sputtered Au 3000 5000A, Plate 1-6 microns |