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Ion Beam Milling Article on Ion Beam Etching published in December Issue of High Frequency Electronics

In the Fall of 2017, Ion Beam Milling engaged the services of Tom Perkins, Senior Editor of High Frequency Electronics Magazine to assist with a head-to-head test of Chemical Etching versus Ion Beam Etching.  Tom Perkins designed the filters used for the testing and oversaw the test process itself along with Jim Barrett, Managing Director of Ion Beam Milling.  In head to head comparison testing measured using an Anritsu VNA, the Ion Beam Milling process demonstrated its superiority, producing better performance and consistency when compared to the Chemically Etched Circuits.  The initial results of this testing was documented in a Feature Article in the December 2017 issue of High Frequency Electronics Magazine.