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Managing Director Jim Barrett to deliver Presentation comparing Ion Beam Etching to Chemical Etching at iMAPS New England 45th annual symposium May 1, 2018

At the 45th Annual New England iMAPS Symposium on May 1, 2018, Jim Barrett will be delivering a presentation documenting the results of a recent experiment comparing the results of Ion Beam Etched Circuits to Chemically Etched ones.  This presentation will be based upon the recently published article in the December 2017 issue of High Frequency Electronics and the expanded whitepaper released by Ion Beam Milling in January.